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Detection of Defect Patterns on Wafer Bin Map Using Fully Convolutional Data Description (FCDD)
Seung-Jun Jang
, Suk Joo BaeJournal of Korean Society of Industrial and Systems Engineering :: Vol.46 No.2 pp.1-12
DOI:https://doi.org/10.11627/jksie.2023.46.2.001
Open abstract
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A Study on Image Annotation Automation Process using SHAP for Defect Detection
Jin Hyeong Jung
, Hyun Su Sim, Yong Soo KimJournal of Korean Society of Industrial and Systems Engineering :: Vol.46 No.1 pp.76-83
DOI:https://doi.org/10.11627/jksie.2023.46.1.076
Open abstract
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Text Based Explainable AI for Monitoring National Innovations
Jung Sun Lim
, Seoung Hun BaeJournal of Korean Society of Industrial and Systems Engineering :: Vol.45 No.4 pp.1-7
DOI:https://doi.org/10.11627/jksie.2022.45.4.001
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